June 15-16, 2005
Holon Academic Institute of Technology, Holon, Israel
Invitation
The conference on Scanning Probe Microscopy will address fundamental aspects of SPM application in different fields such as: Electronics, Life Science, Materials Science and Mechanics, Industrial and Technical applications. Equipment display and exhibit will run in parallel.
The conference will include a plenary session and the following parallel sessions:
- Soft matter (SM)
- Mechanical properties (MP)
- Nanomanipulation and Nanostructuring (NN)
- Electronic and Optical Characteristics (EOC)
- Nanoscale Structure (NS)
- Industrial and Technological Applications (ITA)
- Exhibition (EB)
Abstracts for both oral and poster contributions are invited for all sessions.
Plenary speakers: Prof. B. Bhushan (USA), Dr. B. Terris (USA), Prof. W. Brostow (USA), Prof. L-M. Peng (China), Prof. P. Ebert (Germany), Prof. A. Lewis (Israel)
We look forward to see you with us, in what we hope will be a stimulating conference.
Organizing Committee
Important Dates:
Abstracts due: May 15, 2005
Confirmation of acceptance: May 27, 2005
Pre-registration: June 1, 2005